An in Circuit Tester is a tool that can be used for testing the functioning of various electronics components and the overall system of an electronic device. It is used as a non-invasive testing device that is designed to do the task without causing any type of damages to the device or components. It is also very cost-effective and is designed to perform certain tasks without using any kind of complex tools.
Two types of boards are available: scanner boards for speed, and relay boards for high power and precision. A variety of test functions are available to suit individual applications.
Communication with Windows-based PCs via LAN is available. Operation is easy in an environment familiar to everyone.
Strengthened data editing functions
Use these functions to develop and modify groups of test data such as for multi-cut boards or data managed in multiple fi les, by modifying only the necessary parts.
Data measured by Model 1220 can be saved to a PC?s hard disk for each board tested. Data is stored in CSV format, which can be adapted to many applications.
Functions combined in one bench-top cabinet
In-circuit testing functions are assembled into a system or line to save space in the testing facility, enabling easy support of cell production.
Includes the macro test, a high-performance capability for testing even with only a few measurement points (see page 3 for details)
High-speed test 1
Faster in-circuit testing is achieved by a new measurement board design
High-speed test 2
Optional board parallel testing greatly shortens test time.
Self-diagnosis of Model 1220 can be initiated over the Internet, enabling remote maintenance support even at factories located overseas.
Test data from the HIOKI 1105 can be converted. Model 1101/1102 test data can be converted by the 1137-02 data generation software. Data conversion functions also support data from other companies.
Because of its easy network confi guration, customers can operate the system as their requirements demand. Test data from multiple 1220s can be centrally managed by a server PC. Applications can be constructed to include operations such as capturing test history, statistical data and operating conditions of each machine.