The HIOKI FA1815-20 is a horizontal flying probe tester designed for high-speed bare board inspection and high insulation resistance testing. It is especially suitable for probe card substrates, high-density printed wiring boards and fine-pattern circuit boards used in semiconductor-related production.
FA1815-20 is designed to improve both inspection efficiency and reliability for advanced bare board applications. By combining high-speed testing, high probing precision and high insulation resistance measurement, the system is suitable for dense and complex boards where stable contact, low-stress inspection and reliable defect detection are required.
| Feature | Description |
|---|---|
| Optimized for probe card substrates | Suitable for dense probe-card circuit boards used in advanced semiconductor wafer inspection applications. |
| High-speed inspection | Supports high-speed inspection at up to 100 points/sec. under specified conditions. |
| High insulation resistance testing | Supports high insulation resistance measurement for detecting latent defects such as micro-shorts, voids and impurities. |
| Low-stress inspection | Designed for reliable insulation testing with low applied voltage, helping reduce electrical stress on fine-pattern boards. |
| High probing precision | Accurate probing supports fine pads, narrow pitches and high-density circuit patterns. |
| Large and complex board support | Suitable for large and complex microfabrication circuit boards, including probe card-related substrates. |
| Fixtureless testing | Flying probe testing helps reduce preparation time and cost because no dedicated test fixture is required for standard inspection. |
| Model | FA1815-20 |
|---|---|
| Product type | Horizontal Flying Probe Tester |
| Main application | Probe card substrates, high-density boards and fine-pattern circuit boards |
| Inspection speed | Max. 100 points/sec. |
| Insulation resistance testing | Up to 100 GΩ with 10 V applied voltage |
| Microcurrent detection | As small as 100 pA |
| Maximum inspection range | Up to 340 mm × 340 mm |
| Inspection steps | Up to 4 million inspection steps |
| Minimum pitch / pad size | Kelvin Probe CP1072-36: minimum pitch 85 μm, minimum pad size 55 μm. Single Probe CP1075-09: minimum pitch 34 μm, minimum pad 4 μm. |
| Main applications | Probe card substrates, high-density PCBs, fine-pattern boards and advanced bare board reliability testing |
Catalogs, technical information and model selection support are available upon request.
Please contact Seika Sangyo GmbH for more details about HIOKI bare board testers.
HIOKI offers a lineup of bare board testers for various PCB inspection requirements, including high-speed open-short testing, ultra-high precision probing, probe card substrates, vertical double-sided inspection and advanced IC substrates.
