The HIOKI FA1817 is a vertical double-sided flying probe tester designed to minimize bending of test substrates while providing high-speed and high-precision bare board inspection. It supports simultaneous double-sided testing with four arms, making it suitable for standard bare boards, motherboards, flexible boards and applications requiring stable low-resistance and high-insulation-resistance measurement.
FA1817 is designed for vertical, double-sided inspection with a compact installation space. By testing the board in a vertical position, the system helps reduce substrate bending during inspection. It combines high-speed testing, accurate probing, laser board-thickness compensation and stable electrical measurement to support reliable bare board inspection.
| Feature | Description |
|---|---|
| Vertical double-sided inspection | The FA1817 tests both surfaces simultaneously using four arms, with two arms on the front side and two arms on the rear side. |
| Minimized board bending | The vertical test format is designed to minimize bending of the test substrate during inspection. |
| High-speed inspection | Supports high-speed inspection at up to 100 points/sec. under specified conditions. |
| Accurate probing support | High-resolution cameras with high-power lenses and laser board-thickness compensation help ensure accurate probing and optimal contact. |
| Stable electrical measurement | Ships standard with high-speed low-resistance measurement and high-insulation-resistance measurement functionality. |
| Reduced probe impact | Proprietary probes enable shallower probing marks while maintaining inspection speed and reliability. |
| Space-saving design | The FA1817 can inspect boards up to 610 mm × 510 mm while using a compact installation area compared with legacy models. |
| Model | FA1817 |
|---|---|
| Product type | Vertical double-sided Flying Probe Tester |
| Number of arms | 4 arms, 2 on the front side and 2 on the rear side |
| Measurement speed | Max. 100 points/sec. |
| Testable board size | 50 mm × 50 mm to 610 mm × 510 mm |
| Maximum testable area | 604 mm × 504 mm |
| Board thickness | Standard: 1.0 mm to 3.2 mm. Pneumatic board clamp option: 0.6 mm to 6.0 mm. |
| Minimum pad pitch | 45 μm with CP1075-09 |
| Minimum pad size | 15 μm square with CP1075-09 |
| Main applications | Double-sided bare boards, motherboards, flexible boards and large board reliability testing |
Catalogs, technical information and model selection support are available upon request.
Please contact Seika Sangyo GmbH for more details about HIOKI bare board testers.
HIOKI offers a lineup of bare board testers for various PCB inspection requirements, including high-speed open-short testing, ultra-high precision probing, probe card substrates, vertical double-sided inspection and advanced IC substrates.
